Build Custom Visual Inspection
AI-powered ADC:
AI automates defect classification judgment.Build with precision:
Train high-accuracy models on demand.Smart annotation:
Label defects with precision tools.Active Learning:
Improve model over time from real-time data.Book Demo
Book your demo for the most advanced AI platform in visual inspection and virtual metrology for manufacturing.
We've experienced a remarkable 40-60% increase in submicron defect detection. Averroes has saved us over 300 hours/month/app of labor and increased our productivity by more than 30% .
Automation Manager
@
Semiconductor OEM
Our key features
Build Visual Inspection Applications for Semiconductor
Get Access to the Most Advanced No-code Platform for Visual Inspection
Defect Detection for the Semiconductor Industry
Frequently asked questions
No. Averroes functions seamlessly on existing visual inspection equipment, leveraging advanced computer vision technology, whether it's KLA Tencor, AOI, or Onto equipment. No additional hardware purchase is needed.