Visual Inspection. Virtual Metrology. Advanced Process Control.
AI Semiconductor Manufacturing
Inspection Software
Smarten up your semiconductor manufacturing with Averroes.ai’s custom, high-accuracy AI models. Our advanced deep learning engine generates custom models using very little data, with no data science expenses required, within hours. This ensures near-zero false positives and significantly boosts yield and efficiency. As your AI partner, we extend your capabilities and drive your success.
Key features
Maximizing Efficiency and Reliability
Automated Judgment and Defect Review
Streamline the inspection process by automating defect detection and classification, reducing manual intervention and review time.
Continuous Learning
Our AI actively learns from new data, continuously improving its defect detection and classification capabilities. Unlike traditional inspection equipment limited to pre-programmed defects, our platform adapts to detect new and emerging defects, enhancing overall inspection flexibility and efficiency.
Near Zero False Positives
Achieve unparalleled accuracy with advanced AI that significantly reduces false positives based on precise judgment criteria or thresholds, ensuring only defects are flagged. This addresses the inefficiencies of traditional inspection systems that may struggle with high false positive rates, leading to unnecessary rework and reduced productivity.
Smart Augmentation
Our deep learning model trains the system to detect defects in different lighting and other conditions, ensuring comprehensive defect detection. Traditional inspection systems often fail to detect defects caused by seal or glue errors, but our advanced imaging ensures accurate detection without additional technology investments.
Real-Time Inspection and Monitoring
Perform high-speed, real-time analysis, allowing for rapid inspection without compromising accuracy. Gain insights through an interactive monitoring dashboard, providing continuous oversight and proactive quality control.
Seamless Integration and Scalability
Easily integrate with existing inspection systems and production workflows. Our platform scales to meet the needs of both small manufacturers and large-scale production facilities, ensuring consistent performance and efficiency.
Virtual Metrology
5 Seconds to Predict Parameters vs. 2.5 Hours for Traditional Virtual Metrology Model measures surface roughness and other critical parameters with precision. Our AI-driven virtual metrology solutions provide accurate, real-time measurements, enhancing quality control and process optimization.
Yield Enhancement
Advanced Process Control
Learn more Virtual Metrology Model measures surface roughness and other critical parameters with precision. Our AI-driven virtual metrology solutions provide accurate, real-time measurements, enhancing quality control and process optimization.
Deployment, Security, and Privacy
Deploy our solution according to your needs: completely offline using our on-premise solution, in the cloud, or on a private cloud. Our platform ensures the highest standards of security and privacy, safeguarding your sensitive data while maintaining operational efficiency.
Experience the Averroes AI Advantage
Elevate Your Visual Inspection Capabilities
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