Automated AI Defect Classification For Manufacturing

Transform Your Visual Inspection with Advanced AI Solutions

Build custom AI defect detection models in hours, no data science expertise needed. Achieve near-zero false positives, accurate defect classification, and train with just 20 images per class. That's how you supercharge your quality control.

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Smarten Up Existing
Visual Inspection Equipment with AI
Optimize inspections with AI visual systems—no extra hardware or production disruptions. Integrate seamlessly with your current equipment for smarter, faster manufacturing.
Advanced AI Features for Manufacturing
Transforming Semiconductor Defect Classification
Explore the different features that make our platform the best end-to-end platform for AI development.
Our intuitive labeling tool allows users to quickly annotate images, making the data preparation phase straightforward and efficient. Spend less time on setup and more time on what matters—achieving high accuracy in defect classification.
At the core of our system is a sophisticated classification engine that utilizes advanced machine learning algorithms to deliver industry-leading accuracy. Adaptable to your specific needs, it ensures that defects are identified and categorized with near-zero false positives.
Deploying your custom AI models has never been easier. Our platform supports quick and seamless model deployment, enabling your team to integrate AI-driven inspections into your workflow with minimal disruption.
Harness the power of feedback learning to improve your defect classification system over time. Our technology learns from new data, refining its algorithms to enhance accuracy and performance, ensuring that your inspections stay ahead of evolving production challenges.
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Active Learn-o-matic feature

Active Learn-o-matic

Our Active Learn-o-matic feature enhances our Automated Defect Classification by using active learning algorithms that continuously refine accuracy with new data. This eliminates manual updates, ensuring your defect classification evolves with your production processes for greater reliability and efficiency.
No-Code AI Platform feature

No-Code AI Platform

Take charge of defect classification with our No-Code AI Platform. Build and deploy custom models effortlessly—no programming required. Whether tackling accuracy issues or seeking tailored AI solutions, our platform simplifies the process in just a few steps.
Privacy and Security feature

Robust Privacy and Security Options

Protect your data with our comprehensive privacy and security solutions. Choose on-premise deployment for enhanced privacy and speed or our scalable cloud options for performance. Our cloud-agnostic platform ensures seamless integration, offering flexibility to meet your needs.
Catch Unknown feature

Catch Unknown Defects

Achieve comprehensive quality control with our Averroes WatchDog feature. Unlike traditional systems that rely on pre-configured categories, our technology ensures no defect goes uncaught, enabling real-time identification of unknown defects.
Automate Defect Judgment Process feature

Automated Defect Judgment

Set specific thresholds to prioritize critical defects, allowing your team to focus on throughput and yield. Our system handles assessments, removing subjectivity for consistent, objective judgment that boosts inspection efficiency.
Complete Storytelling feature

Comprehensive Insights with Complete Storytelling

Harness our Complete Storytelling feature to analyze defects, wafers, and masks from A to Z. Gain vital insights from historical data to enhance decision-making and quality control, enabling your team to proactively address issues and drive continuous improvements.
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We've experienced a remarkable 40-60% increase in submicron defect detection. Averroes has saved us over 300 hours/month/app of labor and increased our productivity by more than 30% .
Automation Manager
@
Semiconductor OEM
Frequently asked questions
AI defect classification uses advanced algorithms to automatically identify and categorize defects in manufacturing processes, improving accuracy and reducing human error.

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