free webinar
AI for Photomask Inspection: Reducing False Rejects and Automating Judgment at Scale
In today’s semiconductor manufacturing environment, photomask inspection remains one of the most manual, time-consuming, and error-prone stages in the production process. Engineers often spend hours reviewing defect candidates only to discover that many are false rejects. This leads to unnecessary rework, lost throughput, and reduced yield. Traditional inspection tools struggle to keep up with evolving product complexity, and increasing human review capacity adds cost and inconsistency.
Dates and Times:
America/Los_Angeles:
Date: September 9th, 2025, 11:00 AM
Time: 11:00 AM
Duration: 1 Hour
Manual defect reviews slowing you down? High false reject rates impacting your yield?
Join us for a live webinar and learn how manufacturers are using AI to modernize photomask inspection, replacing time-consuming manual checks with real-time, high-accuracy automation. In this session, you’ll see how Averroes.ai enables:
- 96% automation of manual judgment tasks
- Real-time learning from your photomask data, with no need for coding
- Significant reduction in false rejects, leading to higher throughput and fewer escapes
- Rapid deployment using your existing infrastructure (no new hardware required)
What to expect:
- A live demo of Averroes.ai identifying critical defects
- Case studies from global semiconductor fabs
- How our platform integrates with your current inspection tools
- Steps to get started, from dataset sharing to proof of concept in just weeks
Location: Online
Live Q&A: Get your questions answered by our technical team
Whether you’re exploring AI for the first time or actively upgrading your inspection process, this session will give you practical insight into what’s possible, and how fast you can get there.
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