free webinar

AI for Photomask Inspection: Reducing False Rejects and Automating Judgment at Scale

In today’s semiconductor manufacturing environment, photomask inspection remains one of the most manual, time-consuming, and error-prone stages in the production process. Engineers often spend hours reviewing defect candidates only to discover that many are false rejects. This leads to unnecessary rework, lost throughput, and reduced yield. Traditional inspection tools struggle to keep up with evolving product complexity, and increasing human review capacity adds cost and inconsistency. Averroes.ai offers a smarter approach. Our AI-powered inspection platform automates the defect judgment process with high accuracy, significantly reduces false rejects, and continuously learns from your production data. All of this happens without requiring any changes to your existing infrastructure. Whether you are dealing with complex defect types, inconsistent classifications, or limited inspection resources, Averroes.ai helps streamline your workflow and improve both quality and efficiency across the fab.

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Dates and Times:

America/Los_Angeles:
Date: September 23rd, 2025, 11:00 AM
Time: 11:00 AM
Duration: 1 Hour

Manual defect reviews slowing you down? High false reject rates impacting your yield?

Join us for a live webinar and learn how manufacturers are using AI to modernize photomask inspection, replacing time-consuming manual checks with real-time, high-accuracy automation. In this session, you’ll see how Averroes.ai enables:

  • 96% automation of manual judgment tasks
  • Real-time learning from your photomask data, with no need for coding
  • Significant reduction in false rejects, leading to higher throughput and fewer escapes
  • Rapid deployment using your existing infrastructure (no new hardware required)

What to expect:

  • A live demo of Averroes.ai identifying critical defects
  • Case studies from global semiconductor fabs
  • How our platform integrates with your current inspection tools
  • Steps to get started, from dataset sharing to proof of concept in just weeks

Location: Online

Live Q&A: Get your questions answered by our technical team

Whether you’re exploring AI for the first time or actively upgrading your inspection process, this session will give you practical insight into what’s possible, and how fast you can get there.

Speakers
Omar Altamimi, Chief Data Scientist & founder at Averroes AI
Omar Altamimi
Chief Data Scientist & founder
Averroes AI
Tareq Aljaber, CEO & founder at Averroes AI
Tareq Aljaber
CEO & founder
Averroes AI
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